Difference between revisions of "Projects:ThicknessSlicer3Module"
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| + | = Thickness Slicer 3 Module = | ||
| + | |||
Back to [[NA-MIC_Collaborations|NA-MIC_Collaborations]] | Back to [[NA-MIC_Collaborations|NA-MIC_Collaborations]] | ||
| − | '''Objective | + | '''Objective''' |
| + | |||
| + | Implement a simple command line module for Slicer 3 enabling thickness measurements on appropriate labelmaps (voxel data). | ||
Thickness measurements are performed using correspondences induced by the solution of Laplace's equation. | Thickness measurements are performed using correspondences induced by the solution of Laplace's equation. | ||
| − | '''Progress | + | '''Progress''' Finished an initial implementation. |
| − | '''Key Investigators:''' | + | '''Key Investigators: |
| + | ''' | ||
*BWH: Marc Niethammer, Sylvain Bouix | *BWH: Marc Niethammer, Sylvain Bouix | ||
*Isomics: Steve Pieper. | *Isomics: Steve Pieper. | ||
| − | + | ''Slides from the programming week'' | |
[[Media:2007_Project_Half_Week_ThicknessImageFilter.ppt| 4-block PPT Jan 2007]] | [[Media:2007_Project_Half_Week_ThicknessImageFilter.ppt| 4-block PPT Jan 2007]] | ||
[[Image:ThicknessGUI.png|left|thumb|300px|Automatically generated GUI of the thickness Slicer 3 module.]] | [[Image:ThicknessGUI.png|left|thumb|300px|Automatically generated GUI of the thickness Slicer 3 module.]] | ||
Revision as of 02:03, 4 September 2007
Home < Projects:ThicknessSlicer3ModuleThickness Slicer 3 Module
Back to NA-MIC_Collaborations
Objective
Implement a simple command line module for Slicer 3 enabling thickness measurements on appropriate labelmaps (voxel data). Thickness measurements are performed using correspondences induced by the solution of Laplace's equation.
Progress Finished an initial implementation.
Key Investigators:
- BWH: Marc Niethammer, Sylvain Bouix
- Isomics: Steve Pieper.
Slides from the programming week 4-block PPT Jan 2007
