Difference between revisions of "Projects:ThicknessSlicer3Module"
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Thickness measurements are performed using correspondences induced by the solution of Laplace's equation. | Thickness measurements are performed using correspondences induced by the solution of Laplace's equation. | ||
| − | '''Progress''' Finished an initial implementation. | + | '''Progress''' |
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| + | Finished an initial implementation. | ||
'''Key Investigators: | '''Key Investigators: | ||
Revision as of 02:03, 4 September 2007
Home < Projects:ThicknessSlicer3ModuleThickness Slicer 3 Module
Back to NA-MIC_Collaborations
Objective
Implement a simple command line module for Slicer 3 enabling thickness measurements on appropriate labelmaps (voxel data). Thickness measurements are performed using correspondences induced by the solution of Laplace's equation.
Progress
Finished an initial implementation.
Key Investigators:
- BWH: Marc Niethammer, Sylvain Bouix
- Isomics: Steve Pieper.
Slides from the programming week 4-block PPT Jan 2007
