Difference between revisions of "Projects:ThicknessSlicer3Module"
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'''Key Investigators:''' | '''Key Investigators:''' | ||
| − | * Marc Niethammer, Sylvain Bouix, Steve Pieper. | + | * Marc Niethammer, Sylvain Bouix, Steve Pieper. |
'''Slides from the programming week:''' | '''Slides from the programming week:''' | ||
[[Media:2007_Project_Half_Week_ThicknessImageFilter.ppt| 4-block PPT Jan 2007]] | [[Media:2007_Project_Half_Week_ThicknessImageFilter.ppt| 4-block PPT Jan 2007]] | ||
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| + | |||
| + | [[Image:ThicknessGUI.png|left|thumb|300px|Automatically generated GUI of the thickness Slicer 3 module.]] | ||
Revision as of 14:15, 23 April 2007
Home < Projects:ThicknessSlicer3ModuleBack to NA-MIC_Collaborations
Objective: Implement a simple command line module for Slicer 3 enabling thickness measurements on appropriate labelmaps (voxel data). Thickness measurements are performed using correspondences induced by the solution of Laplace's equation.
Progress: Finished an initial implementation.
Key Investigators:
- Marc Niethammer, Sylvain Bouix, Steve Pieper.
Slides from the programming week: 4-block PPT Jan 2007
