Difference between revisions of "Projects:ThicknessSlicer3Module"
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Revision as of 13:32, 4 September 2007
Home < Projects:ThicknessSlicer3ModuleThickness Slicer 3 Module
Back to NA-MIC_Collaborations
Objectives
Implement a simple command line module for Slicer 3 enabling thickness measurements on appropriate labelmaps (voxel data). Thickness measurements are performed using correspondences induced by the solution of Laplace's equation.
Progress
Finished an initial implementation.
Key Investigators
- BWH: Marc Niethammer, Sylvain Bouix
- Isomics: Steve Pieper
Links
Project Week Results: Jan 2007
