Difference between revisions of "Projects:ThicknessSlicer3Module"
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Revision as of 14:11, 23 April 2007
Home < Projects:ThicknessSlicer3ModuleBack to NA-MIC_Collaborations
Objective: Implement a simple command line module for Slicer 3 enabling thickness measurements on appropriate labelmaps (voxel data). Thickness measurements are performed using correspondences induced by the solution of Laplace's equation.
Progress: Finished an initial implementation.
Key Investigators:
- Marc Niethammer, Sylvain Bouix, Steve Pieper.
Slides from the programming week: 4-block PPT Jan 2007