Difference between revisions of "Projects:ThicknessSlicer3Module"

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'''Key Investigators:'''
 
'''Key Investigators:'''
* Marc Niethammer, Sylvain Bouix, Steve Pieper.  
+
*BWH: Marc Niethammer, Sylvain Bouix
 +
*Isomics: Steve Pieper.  
  
 
'''Slides from the programming week:'''
 
'''Slides from the programming week:'''

Revision as of 16:32, 3 May 2007

Home < Projects:ThicknessSlicer3Module
Back to NA-MIC_Collaborations

Objective: Implement a simple command line module for Slicer 3 enabling thickness measurements on appropriate labelmaps (voxel data). Thickness measurements are performed using correspondences induced by the solution of Laplace's equation.

Progress: Finished an initial implementation.

Key Investigators:

  • BWH: Marc Niethammer, Sylvain Bouix
  • Isomics: Steve Pieper.

Slides from the programming week: 4-block PPT Jan 2007


Automatically generated GUI of the thickness Slicer 3 module.