Difference between revisions of "Projects:ThicknessSlicer3Module"

From NAMIC Wiki
Jump to: navigation, search
(No difference)

Revision as of 16:12, 21 August 2007

Home < Projects:ThicknessSlicer3Module
Back to NA-MIC_Collaborations

Objective: Implement a simple command line module for Slicer 3 enabling thickness measurements on appropriate labelmaps (voxel data). Thickness measurements are performed using correspondences induced by the solution of Laplace's equation.

Progress: Finished an initial implementation.

Key Investigators:

  • BWH: Marc Niethammer, Sylvain Bouix
  • Isomics: Steve Pieper.

Slides from the programming week: 4-block PPT Jan 2007


Automatically generated GUI of the thickness Slicer 3 module.