Projects:ThicknessSlicer3Module

From NAMIC Wiki
Revision as of 14:15, 23 April 2007 by Niethammer (talk | contribs)
Jump to: navigation, search
Home < Projects:ThicknessSlicer3Module
Back to NA-MIC_Collaborations

Objective: Implement a simple command line module for Slicer 3 enabling thickness measurements on appropriate labelmaps (voxel data). Thickness measurements are performed using correspondences induced by the solution of Laplace's equation.

Progress: Finished an initial implementation.

Key Investigators:

  • Marc Niethammer, Sylvain Bouix, Steve Pieper.

Slides from the programming week: 4-block PPT Jan 2007


Automatically generated GUI of the thickness Slicer 3 module.